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KMID : 1102020180480020049
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Applied Microscopy
2018 Volume.48 No. 2 p.49 ~ p.53
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Transmission Electron Microscope Specimen Preparation of Si-Based Anode Materials for Li-Ion Battery by Using Focused Ion Beam and Ultramicrotome
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Chae Jeong-Eun
Yang Jun-Mo
Kim Sung-Soo
Park Ju-Cheol
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Abstract
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A successful transmission electron microscope (TEM) analysis is closely related to the preparation of the TEM specimen and should be followed by the suitable TEM specimen preparation depending on the purpose of analysis and the subject materials. In the case of the Si-based anode material, lithium atoms of formed Li silicide were removed due to ion beam and electron beam during TEM specimen preparation and TEM observation. To overcome the problem, we proposed a new technique to make a TEM specimen without the ion beam damage. In this study, two types of test specimens from the Si-based anode material of Li-ion battery were prepared by respectively adopting the only focused ion beam (FIB) method and the new FIB-ultramicrotome method. TEM analyses of two samples were conducted to compare the Ga ion damage of the test specimen.
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KEYWORD
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Li ion battery, Si-based anode material, Focused ion beam, Ultramicorome, Transmission electron microscopy
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